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2024
A. Iesurum, Manente, D., Padovan, F., Bassi, M., and Bevilacqua, A., Analysis and Design of Coupled PLL-Based CMOS Quadrature VCOs, IEEE Journal of Solid-State Circuits, vol. 59, pp. 294-306, 2024.
A. Bevilacqua and Mazzanti, A., Analysis of CMRR in Doubly-Tuned Transformer Baluns, IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 71, pp. 4874-4878, 2024.
2022
A. Iesurum, Manente, D., Padovan, F., Bassi, M., and Bevilacqua, A., A 24 GHz Quadrature VCO Based on Coupled PLL with -134 dBc/Hz Phase Noise at 10 MHz Offset in 28 nm CMOS, in ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC), 2022.
A. Bettini, Cosnier, T., Magnani, A., Syshchyk, O., Borga, M., Decoutere, S., and Neviani, A., Analysis and Design of a Fully-Integrated Pulsed LiDAR Driver in 100V-GaN IC Technology, in 2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME), 2022.
F. Quadrelli, Manente, D., Seebacher, D., Padovan, F., Bassi, M., Mazzanti, A., and Bevilacqua, A., A Broadband 22-31-GHz Bidirectional Image-Reject Up/Down Converter Module in 28-nm CMOS for 5G Communications, IEEE Journal of Solid-State Circuits, vol. 57, pp. 1968-1981, 2022.
F. Quadrelli, Manente, D., Seebacher, D., Padovan, F., Bassi, M., Mazzanti, A., and Bevilacqua, A., A Broadband 22-31-GHz Bidirectional Image-Reject Up/Down Converter Module in 28-nm CMOS for 5G Communications, IEEE Journal of Solid-State Circuits, vol. 57, pp. 1968-1981, 2022.
N. Modolo, De Santi, C., Baratella, G., Bettini, A., Borga, M., Posthuma, N., Bakeroot, B., You, S., Decoutere, S., Bevilacqua, A., Neviani, A., MENEGHESSO, G., Zanoni, E., and Meneghini, M., Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices, IEEE Transactions on Electron Devices, pp. 1-6, 2022.
N. Modolo, De Santi, C., Baratella, G., Bettini, A., Borga, M., Posthuma, N., Bakeroot, B., You, S., Decoutere, S., Bevilacqua, A., Neviani, A., MENEGHESSO, G., Zanoni, E., and Meneghini, M., Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices, IEEE Transactions on Electron Devices, pp. 1-6, 2022.
N. Modolo, De Santi, C., Baratella, G., Bettini, A., Borga, M., Posthuma, N., Bakeroot, B., You, S., Decoutere, S., Bevilacqua, A., Neviani, A., MENEGHESSO, G., Zanoni, E., and Meneghini, M., Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices, IEEE Transactions on Electron Devices, pp. 1-6, 2022.
F. Chiocchetta, De Santi, C., Rampazzo, F., Mukherjee, K., Grünenpütt, J., Sommer, D., Blanck, H., Lambert, B., Gerosa, A., MENEGHESSO, G., Zanoni, E., and Meneghini, M., GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse, in 2022 IEEE International Reliability Physics Symposium (IRPS), 2022.
F. Chiocchetta, De Santi, C., Rampazzo, F., Mukherjee, K., Grünenpütt, J., Sommer, D., Blanck, H., Lambert, B., Gerosa, A., MENEGHESSO, G., Zanoni, E., and Meneghini, M., GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse, in 2022 IEEE International Reliability Physics Symposium (IRPS), 2022.
F. Chiocchetta, De Santi, C., Rampazzo, F., Mukherjee, K., Grünenpütt, J., Sommer, D., Blanck, H., Lambert, B., Gerosa, A., MENEGHESSO, G., Zanoni, E., and Meneghini, M., GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse, in 2022 IEEE International Reliability Physics Symposium (IRPS), 2022.

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