| Title | GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse |
| Publication Type | Conference Paper |
| Year of Publication | 2022 |
| Authors | Chiocchetta, F, De Santi, C, Rampazzo, F, Mukherjee, K, Grünenpütt, J, Sommer, D, Blanck, H, Lambert, B, Gerosa, A, MENEGHESSO, G, Zanoni, E, Meneghini, M |
| Conference Name | 2022 IEEE International Reliability Physics Symposium (IRPS) |
| DOI | 10.1109/IRPS48227.2022.9764510 |