%0 Journal Article %J MICROELECTRONICS RELIABILITY %D 1999 %T Test structures and testing methods for electrostatic discharge: results of PROPHECY project %A MENEGHESSO, G. %A Zanoni, E. %A Gerosa, A. %A PAVAN, P. %A STADLER, W. %A ESMARK, K. %A GUGGENMOS, G. %B MICROELECTRONICS RELIABILITY %V 39 %P 635–646