%0 Conference Paper %B 2022 IEEE International Reliability Physics Symposium (IRPS) %D 2022 %T GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse %A Chiocchetta, F. %A De Santi, C. %A Rampazzo, F. %A Mukherjee, K. %A Grünenpütt, Jan %A Sommer, Daniel %A Blanck, Hervé %A Lambert, Benoit %A Gerosa, A. %A MENEGHESSO, G. %A Zanoni, E. %A Meneghini, M. %B 2022 IEEE International Reliability Physics Symposium (IRPS) %G eng %R 10.1109/IRPS48227.2022.9764510