%0 Journal Article %J IEEE Transactions on Electron Devices %D 2022 %T Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices %A Modolo, N. %A Santi, C. De %A Baratella, G. %A Bettini, A. %A Borga, M. %A Posthuma, N. %A Bakeroot, B. %A You, S. %A Decoutere, S. %A Bevilacqua, A. %A Neviani, A. %A MENEGHESSO, G. %A Zanoni, E. %A Meneghini, M. %B IEEE Transactions on Electron Devices %P 1-6 %G eng %R 10.1109/TED.2022.3184622 %0 Conference Paper %B 2022 IEEE International Reliability Physics Symposium (IRPS) %D 2022 %T GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse %A Chiocchetta, F. %A De Santi, C. %A Rampazzo, F. %A Mukherjee, K. %A Grünenpütt, Jan %A Sommer, Daniel %A Blanck, Hervé %A Lambert, Benoit %A Gerosa, A. %A MENEGHESSO, G. %A Zanoni, E. %A Meneghini, M. %B 2022 IEEE International Reliability Physics Symposium (IRPS) %G eng %R 10.1109/IRPS48227.2022.9764510 %0 Journal Article %J MICROELECTRONICS RELIABILITY %D 1999 %T Test structures and testing methods for electrostatic discharge: results of PROPHECY project %A MENEGHESSO, G. %A Zanoni, E. %A Gerosa, A. %A PAVAN, P. %A STADLER, W. %A ESMARK, K. %A GUGGENMOS, G. %B MICROELECTRONICS RELIABILITY %V 39 %P 635–646