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ICARUS Integrated Circuits for Analog and RF µ-Systems

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M. Ruzzarin, Meneghini, M., de Santi, C., Neviani, A., Yu, F., Strempel, K., Fatahilah, M. Fahlesa, Witzigmann, B., Wasisto, H. Suryo, Waag, A., Meneghesso, G., and Zanoni, E., “Demonstration of UV-Induced Threshold Voltage Instabilities in Vertical GaN Nanowire Array-Based Transistors”, IEEE Transactions on Electron Devices, vol. 66, pp. 2119-2124, 2019.
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N. Modolo, De Santi, C., Baratella, G., Bettini, A., Borga, M., Posthuma, N., Bakeroot, B., You, S., Decoutere, S., Bevilacqua, A., Neviani, A., MENEGHESSO, G., Zanoni, E., and Meneghini, M., “Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices”, IEEE Transactions on Electron Devices, pp. 1-6, 2022.
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ICARUS - Integrated Circuits for Analog and RF µ-Systems

Dipartimento di Ingegneria dell’Informazione , Via Gradenigo 6/B, 35131 Padova, Italy

University of Padova

Phone: +39 049 827 7794

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Recent Publications

  • A Compensation and Calibration Technique for Lumped Hybrid Couplers in Integrated Image-Reject Architectures
  • A 24 GHz Quadrature VCO Based on Coupled PLL with -134 dBc/Hz Phase Noise at 10 MHz Offset in 28 nm CMOS
  • Analysis and Design of a Fully-Integrated Pulsed LiDAR Driver in 100V-GaN IC Technology
  • A 68.6fs_rms-Total-integrated-Jitter and 1.5μs-LocKing-Time Fractional-N Bang-Bang PLL Based on Type-II Gear Shifting and Adaptive Frequency Switching
  • GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse
More...