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Journal Article

M. Ruzzarin, Meneghini, M., de Santi, C., Neviani, A., Yu, F., Strempel, K., Fatahilah, M. Fahlesa, Witzigmann, B., Wasisto, H. Suryo, Waag, A., Meneghesso, G., and Zanoni, E., “Demonstration of UV-Induced Threshold Voltage Instabilities in Vertical GaN Nanowire Array-Based Transistors”, IEEE Transactions on Electron Devices, vol. 66, pp. 2119-2124, 2019.

N. Modolo, De Santi, C., Baratella, G., Bettini, A., Borga, M., Posthuma, N., Bakeroot, B., You, S., Decoutere, S., Bevilacqua, A., Neviani, A., MENEGHESSO, G., Zanoni, E., and Meneghini, M., “Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices”, IEEE Transactions on Electron Devices, pp. 1-6, 2022.