You are here
Biblio
Conference Paper
F. Chiocchetta, De Santi, C., Rampazzo, F., Mukherjee, K., Grünenpütt, J., Sommer, D., Blanck, H., Lambert, B., Gerosa, A., MENEGHESSO, G., Zanoni, E., and Meneghini, M.,
“GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse”, in
2022 IEEE International Reliability Physics Symposium (IRPS), 2022.