@conference {7364367,
	title = {Analysis and design of a 1.1dB-IL third-order Matching Network for Switched-Capacitor PAs},
	booktitle = {Nordic Circuits and Systems Conference (NORCAS): NORCHIP International Symposium on System-on-Chip (SoC), 2015},
	year = {2015},
	month = {Oct},
	pages = {1-4},
	keywords = {Bluetooth, Capacitance, circuit optimisation, circuit simulations, CMOS analogue integrated circuits, CMOS RF metal stack, frequency 2.4 GHz, integrated circuit design, Integrated circuit modeling, Manganese, power amplifiers, Power generation, Radio frequency, Resistance, size 28 nm, switched capacitor networks, switched capacitor power amplifier, switched-capacitor PA, Switches, third-order matching network, voltage 1.1 V},
	doi = {10.1109/NORCHIP.2015.7364367},
	author = {Passamani, A and Ponton, D. and Knoblinger, G. and Bevilacqua, A.}
}
@conference {4541664,
	title = {Design of broadband inductorless LNAs in ultra-scaled CMOS technologies},
	booktitle = {IEEE International Symposium on Circuits and Systems, 2008. ISCAS 2008. },
	year = {2008},
	pages = {1300 -1303},
	keywords = {bandwidth 10 GHz, broadband inductorless LNA, CMOS integrated circuits, feedback, gain 18 dB, integrated circuit design, low noise amplifiers, power 32 mW, shunt-shunt resistive feedback, size 45 nm, ultra-scaled CMOS technology, voltage 1 V, wideband amplifiers},
	doi = {10.1109/ISCAS.2008.4541664},
	author = {Bevilacqua, A. and Camponeschi, M. and Tiebout, M. and Gerosa, A. and Neviani, A.}
}
@article {4012490,
	title = {Design, Simulation, and Testing of a CMOS Analog Decoder for the Block Length-40 UMTS Turbo Code},
	journal = {Communications, IEEE Transactions on},
	volume = {54},
	number = {11},
	year = {2006},
	pages = {1973 -1982},
	keywords = {0.35 micron, 3.3 V, 3G mobile communication, bit-error rate, block length-40 UMTS turbo code, circuit transient behavior, CMOS analog decoder, CMOS analogue integrated circuits, component mismatch, decoding, discrete time systems, discrete-time first-order model, error statistics, fast BER simulation, integrated circuit design, integrated circuit testing, Third Generation Partnership Project standard, transistor-level simulation, turbo codes, universal mobile telecommunications system},
	issn = {0090-6778},
	doi = {10.1109/TCOMM.2006.884836},
	author = {Graell i Amat, A. and Benedetto, S. and Montorsi, G. and Vogrig, D. and Neviani, A. and Gerosa, A.}
}
