@conference {612,
	title = {GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse},
	booktitle = {2022 IEEE International Reliability Physics Symposium (IRPS)},
	year = {2022},
	doi = {10.1109/IRPS48227.2022.9764510},
	author = {Chiocchetta, F. and De Santi, C. and Rampazzo, F. and Mukherjee, K. and Gr{\"u}nenp{\"u}tt, Jan and Sommer, Daniel and Blanck, Herv{\'e} and Lambert, Benoit and Gerosa, A. and MENEGHESSO, G. and Zanoni, E. and Meneghini, M.}
}
