@article {589,
	title = {Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices},
	journal = {IEEE Transactions on Electron Devices},
	year = {2022},
	pages = {1-6},
	doi = {10.1109/TED.2022.3184622},
	author = {Modolo, N. and Santi, C. De and Baratella, G. and Bettini, A. and Borga, M. and Posthuma, N. and Bakeroot, B. and You, S. and Decoutere, S. and Bevilacqua, A. and Neviani, A. and MENEGHESSO, G. and Zanoni, E. and Meneghini, M.}
}
